Anritsu, a global manufacturer of superior detection and inspection equipment for food, pharmaceutical and packaged goods for 50+ years, will unveil its new XR75 Inspection Systems at Booth #3246 during this year’s PROCESS EXPO in Chicago, from September 15-18, 2015.
The precision-engineered, high-sensitivity XR75 series is the latest in Anritsu’s extensive portfolio of advanced inspection and detection systems that set the standard for improving product quality and safety. Given the increasingly stringent regulatory environment, headline-making product recalls and the demand to maintain or improve margins, the XR75 exceeds Anritsu’s already-advanced X-Ray solutions: in addition to industry leading contaminant detection that finds foreign materials other systems may miss, the XR75 Inspection System can pinpoint product shape defects and check for product integrity.
Recognizing both the short-term and long-term needs of today’s processors and manufacturers, Anritsu’s engineers designed the XR75 Inspection System to provide excellent sensitivity at lower energy levels for extended life cycles and a reduced total true cost of ownership. XR75 incorporates Anritsu’s all new technology for critical system components – long life, low power components were implemented including the X-ray tube/generator and detector. Sanitary design was improved with angled surfaces for water run-off, removable curtains for easy cleaning and Anritsu’s signature tool-less belt removal.
In addition, user-friendliness was engineered into this latest X-Ray detection system from Anritsu. Operators will benefit from easier setup and simplified menu structures.
“This energy and cost-efficient inspection system reflects the latest design capabilities that are based on concurrent marketplace demand for the most accurate detection in the most efficient manner,” said Erik Brainard, President and CEO. “The XR75 Inspection System can reduce the lifetime operating cost by over 20 percent compared to other systems, in fact. We are focused on bringing technologies like these enhanced inspection machines that are as effective in ensuring product quality and safety as they are affordable to purchase, own and operate.”
In addition to introducing the XR75 Inspection System, Anritsu will showcase many of its other advanced inspection and detection systems at the 2015 PROCESS EXPO, including:
- High Definition (HD) and UltraHD technologies that detect the smallest contaminants in packaged products while also offering dual line inspection, mass measurement and the discovery of packaging anomalies and any underweight conditions. Anritsu’s updated HD X-Ray inspection systems typically detect metal contaminants as small as 0.4mm diameter and 1.0mm to 2.0mm diameter glass, bones and stones while Anritsu UltraHD technology can detect down to 0.2mm diameter ferrous, non-ferrous and stainless steel spheres at production line speeds.
- DualX X-Ray technologies that analyze two different X-Ray signals at once, allowing manufacturers to better distinguish between product and contaminant.
- Dual Wave metal detectors that simultaneously run 2 independent frequencies for optimized detection of both Ferrous and non-Ferrous metals.
- SSV Checkweighers that are among the most compact and accurate systems within the marketplace. Anritsu offers more than 150 Checkweigher systems, along with a combination Metal Detector-Checkweigher system, and can provide a solution that can fit within almost any line/price point.
As another valuable service to its customers, Anritsu has developed a new proprietary process called Detection360, a four-phase program that determines the proper points of detection and inspection within each customer’s processing environment. The four phases include Discovery, Mapping, Integration, and Performance and ensures the customer’s goals are met
Anritsu offers a wide range of X-Ray Inspection Systems, Checkweighers, Metal Detection Systems, Combination Checkweigher and Metal Detection Systems, Rejector Systems, QuiCCA QA Software, Detection360 and Performa360 Programs.
For more information, visit DetectionPerfection.com.
